Dec 4, 2013 · Applied Materials Inc., Santa Clara, Calif., announces the SEMVision G6, a suite of new defect review and classification technologies for its SEMVision family of products to accelerate time to yield for chip manufacturing at 1X-nm and beyond.

Mar 19, 2021 · Looking to bridge the gap on inspection costs and time, Applied Materials has been developing a technology called ExtractAI technology, which uses a combination of the company's latest Enlight...

Jul 16, 2013 · The Applied SEMVision G6 defect analysis system combines unprecedented high-resolution, multi-dimensional imaging capabilities with revolutionary machine learning intelligence of the Purity (TM) Automatic Defect Classification (ADC) system that sets new performance benchmarks and brings first-of-a-kind DR SEM technology to the semiconductor indu...

The Applied SEMVision G6 defect analysis system combines unprecedented high-resolution, multi-dimensional imaging capabilities with revolutionary machine learning intelligence of the Purity Automatic Defect Classification (ADC) system that sets new performance benchmarks and brings first-of-a-kind DR SEM technology to the semiconductor industry.

SEMVision G6 and Purity ADC solve the industry's toughest process control problems for defect review with unmatched imaging technologies and a powerful analysis tool for fast and accurate classification.

Jul 15, 2013 · The Applied SEMVision G6 defect analysis system combines high-resolution, multi-dimensional imaging capabilities with machine learning intelligence of the Purity automatic defect classification...

Jul 8, 2013 · Applied Materials, Inc. announced a suite of new defect review and classification technologies for its market-leading SEMVision family of products to accelerate time to yield for leading-edge chip manufacturing at 1X-nm and beyond. The Applied SEMVision G6 defect analysis system combines unprecedented high-resolution, multi-dimensional imaging ...

For un-patterned wafers, the G10 enables comprehensive, high-productivity review using an enhanced light source and optics capable of detecting defects <13nm. The SEMVision G10 also leverages and extends state-of-the-art automation solutions, enabling higher fab productivity and accelerating the ramp process to high volume manufacturing.

Jul 8, 2013 · The Applied SEMVision G6 defect analysis system combines unprecedented high-resolution, multi-dimensional imaging capabilities with revolutionary machine learning intelligence of the Purity (TM) Automatic Defect Classification (ADC) system that sets new performance benchmarks and brings first-of-a-kind DR SEM technology to the semiconductor ...

アプライド マテリアルズのSEMVision G6 とPurity ADCは、抜群の画像処理技術に加えて高速・高精度の分類に対応した強力な分析ツールを備え、業界で最も難しいとされる欠陥レビュー時のプロセス制御の問題を解決しました。 すでに大手メーカー数社がSEMVision G6 とPurity ADC を導入し、スループットを最大2. SEMVision G6 の解像度は前世代機と比べて30%向上し、業界最高水準を実現しています。 この高解像度と独自のビームチルト角を備えるG6 は、1x nm …