Scanning Electron Microscope (SEM) imaging and Energy Dispersive Spectroscopy (EDS) mapping of geological and extraterrestrial materials usually require analyzing at relatively high magnifications.

Oct 15, 2019 · Double clicking on the map in the project tree will pull up the mapping data for this area, where you can then view the phase map, composite element map, and individual element maps.

X-ray mapping allows a visible understanding of elemental distributions within a sampling area. Advanced and smart mapping features have been incorporated into APEX™ 2.0 to give a deeper understanding of the material's chemical nature and ensure ease-of-use.

EDAX APEX™ Review is where you can review all types of data and produce reports. Click the EDS icon or Review icon on the top right corner to switch between the two modes.

Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample.

EDAX TEAM™ Phase Mapping is an established and powerful automated software routine with the capability of supporting a large number of Energy Dispersive Spectroscopy (EDS) mapping

Genesis Maps/Line is a software application that allows users to collect X-ray maps and linescans from a scanning electron microscope (SEM). The software provides a range of features for setting up and collecting maps, including specifying the map type, matrix size, dwell time, and data type.

X-Ray Mapping- It is used to study particular elemental distribution. For analysis purpose, electron beam is scanned over a particular area and the related characteristics X-rays are acquired. If the peak to background ratio is very low then X-ray Map does not show the distribution of desired element, i.e., it shows the distribution of

EDS captures and analyzes the characteristic x-rays generated from any material when the intrinsic electron structure in that matter is impacted by a high energy electron beam.

Quickly activate and add elements while mapping to simplify operation and inspection; Select from 40 color options to effortlessly create vibrant images during elemental mapping; Simultaneously map multiple element lines (K, L, M) Dynamic Element Mapping. Interact in real-time to show only the elements while in Mapping and Linescan modes