X-ray photoelectron spectroscopy (XPS) is a powerful technique widely used for the surface analysis of materials. At low energy resolution it provides qualitative and quantitative information on the ...

Fast XPS imaging with high spatial resolution exposes the lateral distribution of surface chemistry and helps in additional characterization by selected area analysis. The AXIS Supra + provides ...

NanoESCA II Photoemission Electron Microscope (PEEM), high-resolution X-ray Photoelectron Spectroscopy (XPS) and Spot Profile Analysis Low Energy Electron Diffraction (SPA-LEED). The PEEM has an ...

XPS imaging is used to measure the lateral distribution of chemistry or elements at the surface. Rapid and high-spatial-resolution parallel images are acquired by the AXIS Supra +. The benefit of ...