JEOL IB-19500CP low angle, low energy ion mill for SEM and TEM sample preparation. This instrument can be reserved for use.

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Gallium-free, high-quality TEM and APT sample preparation is made possible by the new PFIB column, which offers exceptional performance under all operating conditions and permits 500 V Xe + final ...

The ultramicrotomes are mainly used to prepare thin sections for imaging with TEM. Either glass or diamond knifes can ... Low temperature sectioning system for biological and industrial samples at ...